Micro-stress-strain analysis in materials based upon EBSD technique: a review

Ya-min HUANG,Chun-xu PAN
DOI: https://doi.org/10.3969/j.issn.1000-6281.2010.01.001
2010-01-01
Abstract:The constitutive relationship in a micrometer scale in materials is generally used for analyzing failure behavior of materials in macro scale. However,it is impossible to ditermine it using traditional techniques.In recent decade,it has been known that the electron backscatter diffraction(EBSD) technique is a powerful tool for analyzing the local strains in materials.It is an accessory attached to a scanning electron microscope(SEM).It has advantages upon the micro stress-strain analysis with high space resolution,high angular resolution and high strain sensitivity.In this paper,the measuring of principles and methods for both the elastic strain and plastic strain using EBSD are reviewed.The main problems that should be solved in the future are also discussed.
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