Characterization of the Microstructure of Sintered Aln by Sem and Tem

S DU,Z LIU,LT LI,ZL GUI
DOI: https://doi.org/10.1016/0167-577x(95)00166-2
IF: 3
1995-01-01
Materials Letters
Abstract:A series of AlN samples with Y2O3, Yb2O3, Er2O3, CaO as sintering aids were characterized using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), with the objective of understanding the effects of grain size, grain boundary segregation and second-phase distribution on density and thermal conductivity. The higher thermal conductivity of Er2O3-CaO and Yb2O3-CaO doped materials, in comparison with CaO and Y2O3-CaO doped samples, is rationalized in terms of the ease of evaporation of the sintering aids and the microstructure. Oxidation behavior of fresh ion-milled surfaces of AlN samples was also studied.
What problem does this paper attempt to address?