Abstract:In this study, the FIB (Focused Ion Beam) milling method is applied to fabricate high-frequency grating on porous TiNi shape memory alloy (SMA) materials. With the high-quality FIB milling gratings, scanning electron microscopy (SEM) micro-moiré method is successfully employed to measure the large deformations of the porous TiNi SMA under uniaxial compression tests. To cope with the complex experimental patterns associated with the large deformations in the micro-scale regions around the pores, a digital moiré method, which involves random phase shifting and self-adaptive analysis schemes, is utilized to obtain the full-filed deformation and strain distributions around shear bands with high accuracies. During the investigation, it is found that furcated moiré fringes exist at the locations of combined shear bands where strains have abrupt changes; a corresponding explanation is given in the paper. The successful application of the FIB milling gratings also verifies that they are capable of generating high-quality moiré fringes for the micro-scale measurements.

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