Orthogonal Sampling Moiré Method and Its Application in Microscale Deformation Field Measurement
R. Chen,Q. Zhang,W. He,H. M. Xie
DOI: https://doi.org/10.1016/j.optlaseng.2021.106811
IF: 5.666
2022-01-01
Optics and Lasers in Engineering
Abstract:Sampling moire (SM) method is one of the modern deformation measurement methods in photo-mechanics. This method realizes the visualization measurement of deformation field by a sparse sampling of grating images, showing the advantages of high efficiency and strong robustness. However, in the traditional sampling moire method, the unidirectional sampling mode is used with the result that the two-dimensional deformation cannot be acquired at the same time. In this paper, by combining the orthogonal sampling and Fourier phase analysis techniques, an orthogonal sampling moire (OSM) method is proposed with which the two-directional moire phase of specimen grating can be separated synchronously. The accuracy of the OSM method for the deformation measurement is verified by numerical experiments and PMMA uniaxial tensile tests. As an application, in a scanning electron microscope (SEM), the deformation field near the crack tip of small fatigue cracks is measured, based on which the crack opening displacement (COD) and the stress intensity factors (K) are obtained. Furthermore, the crack closure effects at different temperatures are characterized. The experimental results show that the crack closure significantly affects the process of small crack growth at both room temperature and high temperature, and the crack opening load at high temperature is greater than that at room temperature, which indicates that small cracks are easier to close at high temperature.