Heteroepitaxial Growth of 3C-SiC on Si(111) by Solid Source Molecular Beam Epitaxy

Jinfeng Liu,Zhongliang Liu,Kefan Wang,Pengshou Xu,Honggao Tang
DOI: https://doi.org/10.3969/j.issn.1672-7126.2007.01.002
2007-01-01
Abstract:Monocrystalline 3C-SiC films were successfully grown on Si(111) substrates at an optimized substrate temperature of 1100 ℃ by molecular beam epitaxy(MBE) using solid-sources of C and Si for the first time in China.The films,the epitaxial orientation,and the relations between the films and substrates were characterized by in-situ reflection high energy electron diffraction(RHEED),X-ray diffraction(XRD) and Raman spectra.The effect of substrate carbonization on growth of SiC was studied.The results show that the films are 3C-SiC with all cubic axes parallel to the substrates'.The carbonization benefits the quality of films because it can compensate the large lattice-mismatch and introduce more nucleation centers of SiC microcrystal.
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