Graphene films grown on Si substrate via direct deposition of solid-state carbon atoms

J. Tang,C.Y. Kang,L.M. Li,W.S. Yan,S.Q. Wei,P.S. Xu
DOI: https://doi.org/10.1016/j.physe.2011.03.014
2011-01-01
Physica E: Low-Dimensional Systems and Nanostructures
Abstract:Graphene films were grown on Si(111) substrates at different temperatures (600, 700 and 800°C) by directly depositing solid-state carbon atoms through solid-state molecular beam epitaxy (SSMBE). The structural properties were characterized by reflection high energy electron diffraction (RHEED), Raman spectroscopy and near-edge X-ray absorption fine-structure (NEXAFS). The results showed that SiC precipitates primarily formed at 700 and 800°C, as a small quantity of carbon atoms were deposited. When carbon atoms continued depositing, graphene films formed at 800°C and amorphous or polycrystalline carbon thin films formed at 700 and 600°C. We think that graphene films could be grown on Si(111) substrates because of the high activity of carbon atoms at 800°C and weak interaction between carbon atoms and silicon atoms of substrate due to a SiC buffer layer stabilizing the surface of Si substrate.
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