Direct growth of graphitic carbon on Si(111)

Pham Thanh Trung,Frédéric Joucken,Jessica Campos-Delgado,Jean-Pierre Raskin,Benoît Hackens,Robert Sporken
DOI: https://doi.org/10.1063/1.4773989
IF: 4
2013-01-07
Applied Physics Letters
Abstract:Appropriate conditions for direct growth of graphitic films on Si(111) 7 × 7 are investigated. The structural and electronic properties of the samples are studied by Auger electron spectroscopy, X-ray photoemission spectroscopy, low energy electron diffraction (LEED), Raman spectroscopy, and scanning tunneling microscopy (STM). In particular, we present STM images of a carbon honeycomb lattice grown directly on Si(111). Our results demonstrate that the quality of graphene films formed depends not only on the substrate temperature but also on the carbon buffer layer at the interface. This method might be very promising for graphene-based electronics and its integration into the silicon technology.
physics, applied
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