The Behaviour of Very High Current Density Power Mosfets

J Evans,G Amaratunga
DOI: https://doi.org/10.1109/ispsd.1996.509470
IF: 3.1
1997-01-01
IEEE Transactions on Electron Devices
Abstract:A new and complete description of the current carrying mechanisms of a power MOSFET is presented. This is aimed at clarifying the relatively complex behavior of such devices operating at high current densities, with particular reference to the drain-voltage dependence associated with quasi-saturation. This physical insight provides an elegant method of comparing the relative merits of the DMOS and UMOS structures.
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