Quantum Mechanical Consideration On Mosfet'S Characteristics And Scaling

Yutao Ma,Litian Liu,Zhijian Li
IF: 1.019
2000-01-01
Chinese Journal of Electronics
Abstract:In this paper, a thorough review of Quantum Mechanical Effects on nanoscale MOSFET is given. Several aspects including size quantization effects, quantum mechanical consideration of carrier mobility and quantum mechanical tunneling through ultra-thin gate oxide are briefly reviewed. Theoretical investigation method including numerical and simplified approaches are discussed and a new iteration method based on the concept of Surface Layer Effective Density-of-State (SLEDOS) is proposed. Then quantum mechanical correction models both in devices level and circuit level are discussed and a threshold modification model is given. Tunneling through ultra-thin gate oxide is reviewed from both experimental and theoretical point of view and problems in it are discussed. It is concluded that comprehensive quantum mechanical consideration in future devices is inevitable.
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