Discrete Charging in Polysilicon Gates of Single Electron Transistors

Dharmraj Kotekar-Patil,Stefan Jauerneck,David Wharam,Dieter Kern,Xavier Jehl,Romain Wacquez,M. Sanquer
DOI: https://doi.org/10.48550/arXiv.1401.1237
2014-01-06
Mesoscale and Nanoscale Physics
Abstract:Low temperature electron transport measurements of single electron transistors fabricated in advanced CMOS technology with polysilicon gates not only exhibit clear Coulomb blockade behavior but also show a large number of additional conductance fluctuations in the nonlinear regime. By comparison with simulations these features are quantitatively attributed to the effects of discretely charged islands in the polysilicon gates.
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