An analysis on improvement of x-ray diffractometer results by controlling and calibration of parameters

Hamidreza Moradi,Fatemeh Mehradnia

DOI: https://doi.org/10.46793/adeletters.2023.2.3.4

2023-10-17

Abstract:The X-ray diffractometer in the laboratory is a crucial instrument for analyzing materials in science. It can be used on almost any crystal material, and if the machine parameters are appropriately controlled, it can offer a lot of information about the samples characteristics. Nevertheless, the data obtained from these machines are complicated by an aberration function that can be resolved through calibration. In this study, a powder comprising of Barium Sulfate (BaSO4), Zinc Oxide (ZnO) and Aluminum (Al) was used as the first sample and a single crystal sample comprised of Gallium Nitride (GaN) and Aluminum Oxide (Al2O3). The required calibration parameters of the X-ray diffractometer namely: Straight Beam Alignment, Beam Cut Alignment and Sample Tilt Alignment for two samples were analyzed and carried out. Using the results of the X-ray spectrum, important parameters such as corresponding planes for peak positions, d-spacing of planes, intensities, smallest crystallite sizes and lattice parameters, and a comparison with the reference data were all carried out. As another result, the out-of-plane alignment and Full-Width at Half-Maximum (FWHM) value for GaN could be determined using the rocking curve.

Applied Physics

What problem does this paper attempt to address?

The paper aims to address the sources of measurement errors in X-ray diffraction experiments and implement effective calibration procedures. Specifically, the paper explores how to improve the accuracy of X-ray diffractometers through calibration by analyzing X-ray diffraction data from two different samples (one is a powder sample composed of barium sulfate (BaSO₄), zinc oxide (ZnO), and aluminum (Al); the other is a single crystal sample composed of gallium nitride (GaN) and aluminum oxide (Al₂O₃)). Various alignment operations were performed on the samples during the study, including direct beam alignment, beam cut alignment, and sample tilt alignment. The obtained X-ray spectra were used to determine important parameters such as interplanar spacing, minimum crystallite size, crystal structure, and lattice parameters. Additionally, the out-of-plane alignment and full width at half maximum (FWHM) value of the gallium nitride film were determined through rocking curves. This work is of significant importance to research in the fields of materials science and instrumentation, helping to improve the accuracy and reliability of X-ray diffraction data analysis.

An analysis on improvement of x-ray diffractometer results by controlling and calibration of parameters

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