Abstract:For a century, x-ray crystallography has been conducted with one of the two extreme sample conditions: either a single crystal which produces a single set of diffraction spots directly corresponding to the geometric orientation of the crystal, or a powder sample which comprises a huge number of crystals so numerous that the diffraction spots overlap and merge into smooth rings while the geometric relation is completely lost and only the d-spacings information of diffraction planes is observed. High-pressure DAC is not optimized for either condition. Powder x-ray diffraction has the intrinsic limitations when the sample consists of multiple different phases with low symmetry. Diffraction rings cover most of the detector area, and only a couple of low angle diffraction rings are unique to a phase; most other rings overlap with one another and cannot be used for unique identiﬁcation or accurate determination of crystallographic parameters. New structures and minor phases are often overshadowed by the diffraction of major phases and are impossible to ﬁnd or identify. Advanced crystallographic software, such as Rietveld and LeBail reﬁnement methods, may get most out of a powder pattern, but cannot overcome the intrinsic limitations. In addition, the common practice of integrating the 2D ring into a 1D peak plot throws away the valuable information of a whole dimension, such as the azimuthal angle of diffraction spot around the ring. Single-crystal XRD contains orientation and geometrical relationship in addition to d-spacings and thus provides a deﬁnitive characterization of the unit cell and symmetry. Unless the crystal is orientated exactly relative to the incident monochromatic x-ray beam to satisfy the Bragg relation, the crystal gives no signal, and the detector remains empty. Rotating the crystal around the w-axis (perpendicular to the incident x-ray beam) can bring the crystal to Bragg condition and occasionally obtain single diffraction spots at a given angle and scanning step. In spite of the advantages, single crystal cannot be sustained through phase transitions and often breaks down into multiple crystals and generate spotty XRD patterns. Spottiness, that is generally regarded as a ﬂaw in powder XRD, can be turned into great advantages if we can separate individual crystallites and handle them as individual single crystals. The high-brilliance x-ray beam available at synchrotron facilities has made it possible to collect diffraction spots in a powder sample comprised of up to hundreds of submicron crystallites. The newly developed Multigrain Crystallography (MGC) package, which is a suite of programs used for processing and indexing diffraction spots, has been developed to separate and identify the crystallographic orientation of each individual crystallite in the aggregate of hundreds of crystallites. Once separated, the data set for each crystallite can be handled with the standard single-crystal reﬁnement program identical to a stand-alone single crystal, resulting in excellent statistics in reﬁnement and full coverage of the reciprocal space. The MGC method is very powerful in unequivocal determination of symmetry and unit cells, testing different indexing models, picking out minor phases, and resolving strain of individual crystallites, and will very likely replace the powder and single-crystal x-ray diffraction methods as the dominant crystallographic tool for future high pressure-temperature studies in DAC.

Alignment of Sample Position and Rotation During in Situ Synchrotron X-ray Micro-Diffraction Experiments Using a Laue Cross-Correlation Approach

Intermitted 3D diffraction tomography combined with in situ Laue diffraction to characterize dislocation structures and stress fields in micro bending cantilevers

Mapping nanocrystal orientations via scanning Laue diffraction microscopy for multi-peak Bragg coherent diffraction imaging

Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams

Surface Patterning for Combined Digital Image Correlation and Electron Backscatter Diffraction In-Situ Deformation Experiments

A tunable multi-color "rainbow" filter for improved stress and dislocation density field mapping in polycrystals using x-ray Laue microdiffraction

Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis

Refinements for Bragg coherent X-ray diffraction imaging: Electron backscatter diffraction alignment and strain field computation

In situ synchrotron X-ray multimodal experiment to study polycrystal plasticity

Surface Patterning for Multi-Scale Strain Analysis of In-Situ Sem Mechanical Experiments

Application of laboratory micro X-ray fluorescence devices for X-ray topography

Note: Dynamic Strain Field Mapping with Synchrotron X-ray Digital Image Correlation.

A Technique for In-Situ Displacement and Strain Measurement with Laboratory-Scale X-Ray Computed Tomography

Diffractive small angle X-ray scattering imaging for anisotropic structures

Reciprocal space slicing: A time-efficient approach to femtosecond x-ray diffraction

Three-dimensional X-ray structural microscopy with submicrometre resolution

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

Laue microdiffraction on polycrystalline samples above 1500 K achieved with the QMAX‐μLaue furnace

Investigation of Medium to High Strain Deformation Microstructures Using an Automated Electron Backscattering Pattern (EBSP) System

Combining Laue diffraction with Bragg coherent diffraction imaging at 34-ID-C

Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction