Note: Dynamic Strain Field Mapping with Synchrotron X-ray Digital Image Correlation.

L. Lu,D. Fan,B. X. Bie,X. X. Ran,M. L. Qi,N. Parab,J. Z. Sun,H. J. Liao,M. C. Hudspeth,B. Claus,K. Fezzaa,T. Sun,W. Chen,X. L. Gong,S. N. Luo
DOI: https://doi.org/10.1063/1.4887343
IF: 1.6
2014-01-01
Review of Scientific Instruments
Abstract:We present a dynamic strain field mapping method based on synchrotron X-ray digital image correlation (XDIC). Synchrotron X-ray sources are advantageous for imaging with exceptional spatial and temporal resolutions, and X-ray speckles can be produced either from surface roughness or internal inhomogeneities. Combining speckled X-ray imaging with DIC allows one to map strain fields with high resolutions. Based on experiments on void growth in Al and deformation of a granular material during Kolsky bar/gas gun loading at the Advanced Photon Source beamline 32ID, we demonstrate the feasibility of dynamic XDIC. XDIC is particularly useful for dynamic, in-volume, measurements on opaque materials under high strain-rate, large, deformation.
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