Abstract:We present a novel technique to monitor dynamics in interfacial systems through temporal correlations in x-ray photoelectron spectroscopy (XPS) signals. To date, the vast majority of time-resolved x-ray spectroscopy techniques rely on pump–probe schemes, in which the sample is excited out of equilibrium by a pump pulse, and the subsequent dynamics are monitored by probe pulses arriving at a series of well-defined delays relative to the excitation. By definition, this approach is restricted to processes that can either directly or indirectly be initiated by light. It cannot access spontaneous dynamics or the microscopic fluctuations of ensembles in chemical or thermal equilibrium. Enabling this capability requires measurements to be performed in real (laboratory) time with high temporal resolution and, ultimately, without the need for a well-defined trigger event. The time-correlation XPS technique presented here is a first step toward this goal. The correlation-based technique is implemented by extending an existing optical-laser pump/multiple x-ray probe setup by the capability to record the kinetic energy and absolute time of arrival of every detected photoelectron. The method is benchmarked by monitoring energy-dependent, periodic signal modulations in a prototypical time-resolved XPS experiment on photoinduced surface-photovoltage dynamics in silicon, using both conventional pump–probe data acquisition, and the new technique based on laboratory time. The two measurements lead to the same result. The findings provide a critical milestone toward the overarching goal of studying equilibrium dynamics at surfaces and interfaces through time correlation-based XPS measurements.

Dynamic X-ray coherent diffraction analysis: bridging the timescales between imaging and photon correlation spectroscopy

Dynamic X-ray Coherent Diffraction Analysis: Bridging the Time Scales between Imaging and Photon Correlation Spectroscopy

X-Ray Fluorescence Correlation Spectroscopy: A Method for Studying Particle Dynamics in Condensed Matter

High-Resolution Scanning X-ray Diffraction Microscopy

Computational Approaches to Model X-ray Photon Correlation Spectroscopy from Molecular Dynamics

Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection

Dynamics and rheology under continuous shear flow studied by x-ray photon correlation spectroscopy

In situ coherent diffractive imaging

Coherent X-ray Imaging of Stochastic Dynamics

A Flexible Phase Retrieval Framework for Flux-limited Coherent X-Ray Imaging

High-speed X-ray Diffraction for Studying Irreversible Materials Structure Dynamics

Data-driven discovery of dynamics from time-resolved coherent scattering

Enhanced ultrafast X-ray diffraction by transient resonances

Double diffraction imaging of X-ray induced structural dynamics in single free nanoparticles

Real time 3D coherent X-ray diffraction imaging

Cross-correlation analysis of X-ray photon correlation spectroscopy to extract rotational diffusion coefficients

Spectromicroscopy and coherent diffraction imaging: focus on energy materials applications

Time-Resolved X-Ray Scattering of an Electronically Excited State in Metal Complexes in Solution

Real-time interfacial electron dynamics revealed through temporal correlations in x-ray photoelectron spectroscopy

Diffractive small angle X-ray scattering imaging for anisotropic structures