Computational Approaches to Model X-ray Photon Correlation Spectroscopy from Molecular Dynamics

Shaswat Mohanty,Christopher B. Cooper,Hui Wang,Mengning Liang,Wei Cai

DOI: https://doi.org/10.1088/1361-651X/ac860c

2023-01-06

Abstract:X-ray photon correlation spectroscopy (XPCS) allows for the resolution of dynamic processes within a material across a wide range of length and time scales. X-ray speckle visibility spectroscopy (XSVS) is a related method that uses a single diffraction pattern to probe ultrafast dynamics. Interpretation of the XPCS and XSVS data in terms of underlying physical processes is necessary to establish the connection between the macroscopic responses and the microstructural dynamics. To aid the interpretation of the XPCS and XSVS data, we present a computational framework to model these experiments by computing the X-ray scattering intensity directly from the atomic positions obtained from molecular dynamics (MD) simulations. We compare the efficiency and accuracy of two alternative computational methods: the direct method computing the intensity at each diffraction vector separately, and a method based on fast Fourier transform that computes the intensities at all diffraction vectors at once. The computed X-ray speckle patterns capture the density fluctuations over a range of length and time scales and are shown to reproduce the known properties and relations of experimental XPCS and XSVS for liquids.

Numerical Analysis,Atomic Physics

What problem does this paper attempt to address?

The main problem that this paper attempts to solve is to establish the connection between X - ray photon correlation spectroscopy (XPCS) and X - ray speckle visibility spectroscopy (XSVS) data and the microstructure dynamics of materials. Specifically, the author aims to calculate the X - ray scattering intensity through molecular dynamics (MD) simulations, thereby helping to interpret the XPCS and XSVS data observed in experiments. This is helpful for understanding the dynamic processes of materials at different length and time scales and provides theoretical support for the design of new materials.

### Summary of main problems:
1. **Establishing the connection between microstructure dynamics and macroscopic response**:
- XPCS and XSVS can detect the dynamic processes inside materials, but it is necessary to link these experimental data with the underlying physical processes in order to understand the relationship between the macroscopic response of materials and microstructure dynamics.

2. **Developing an efficient computational framework**:
- To assist in the interpretation of XPCS and XSVS data, the author proposes a computational framework to calculate the X - ray scattering intensity directly from the atomic positions obtained by MD simulations. This framework compares two different computational methods: the direct method and the method based on the fast Fourier transform (FFT).

3. **Verifying the effectiveness and accuracy of computational methods**:
- The author tests the efficiency and accuracy of these two methods through the atomic configurations generated by the MD simulation of liquid argon (Ar) and shows that they can reproduce the known experimental results.

### Formula representation:
- **Scattering intensity formula**:
\[
I(q,t)=\sum_{i = 1}^{N}\sum_{j = 1}^{N}f_i(q)f_j(q)e^{-iq\cdot[r_i(t)-r_j(t)]}
\]
where \(f_i(q)\) is the X - ray atomic form factor of atom \(i\), and \(r_i(t)\) is the position of atom \(i\) at time \(t\).

- **Structure factor formula**:
\[
S(q,t)=\frac{1}{N}\sum_{i}\sum_{j}e^{-iq\cdot[r_i(t)-r_j(t)]}
\]

- **Autocorrelation function formula**:
\[
g_2(q,\tau)=\frac{\langle I(q,t)I(q,t + \tau)\rangle_t}{\langle I(q,t)\rangle_t^2}
\]

Through these formulas and computational methods, the author hopes to interpret XPCS and XSVS experimental data more accurately and provide a theoretical basis for further research on the dynamic properties of complex liquids and other materials.