Time-Resolved Digital Image Correlation in the Scanning Electron Microscope for Analysis of Time-Dependent Mechanisms

J.C. Stinville,T. Francis,A.T. Polonsky,C.J. Torbet,M.A. Charpagne,Z. Chen,G.H. Balbus,F. Bourdin,V. Valle,P.G. Callahan,M.P. Echlin,T.M. Pollock
DOI: https://doi.org/10.1007/s11340-020-00632-2
IF: 2.794
2020-08-12
Experimental Mechanics
Abstract:<span><b>Background:</b> Advancements in the Digitial Image Correlation (DIC) technique over the past decade have greatly improved spatial resolution. However, many processes, such as plastic deformation, have a temporal component spanning from fractions of a second to minutes that has not yet been addressed in detail, particularly for DIC conducted in-situ in the scanning electron microscope (SEM). <b>Objective:</b> To develop a methodology for conducting time-resolved digital image correlation in the SEM for analysis of time-dependent mechanical deformation phenomena. Methods: Microscope and electron beam scanning parameters that influence the rate at which time-resolved DIC information is mapped are experimentally investigated, providing a guide for use over a range of timescales and resolutions. <b>Results:</b> Time-resolved DIC imaging is demonstrated on a Ti-7Al alloy, where slip band propagation is resolved with imaging dwell times of seconds. The limits of strain resolution and strain collection speeds are analyzed. <b>Conclusions:</b> The new developed methodology can be applied to a wide range of materials loaded in-situ to quantify time-dependent plastic deformation phenomena.</span>
mechanics,materials science, multidisciplinary, characterization & testing
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