Abstract:Material properties are linked to microstructure, e.g. grain size, grain orientation, phase distribution etc. Accurate crystallographic assignment of phases is critical for correctly assessing properties such as stress and strain in geological materials. In particular, α-quartz (P3121 or P3221) single crystals are prone to various types of twinning, which can lead to ambiguity in grain orientation assignment. Dauphine law twins are a common type of α-quartz twin, where domains with the same chirality intergrow but are distinguishable by a 60° rotation about the c axis of the trigonal unit cell. Proper assignment of single crystal orientation is crucial to accurately determining the stress tensor of the crystal, where misindexation can lead to large errors along the ab plane. At the Advanced Light Source beamline 12.3.2, we have developed energy dispersive diffraction (Laue) coupled with elemental identification using x-ray fluorescence (XRF) with 1-2 um beam size. We use this setup to generate 2D grain maps of polished natural quartz boudin samples from the Bastogne region of Belgium, with dimensions ranging from 160 x 100 um and 1 um step size to 4500 x 2600 um and 20 um step size. Macroscopically, these samples consist of alternating psammite (metamorphic fine-grained sandstone rock) and quartz. We determine quartz grain orientation in these samples unambiguously by using a statistical analysis of peak intensity as a function of indexed orientation in reflections with no harmonic overlap. We then calculate the strain tensor of each Laue pattern (~30,000 in the largest map) and find that all grains display elastic shortening perpendicular to the quartz vein walls, irrespective of grain direction. This indicates that boudinage forms through layer-parallel shortening, contrary to previously held beliefs. This study demonstrates how Laue diffraction can act as a fast, definitive and detailed tool in measurements of rock or mineral deformation.

Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams

Investigation of Medium to High Strain Deformation Microstructures Using an Automated Electron Backscattering Pattern (EBSP) System

Mapping nanocrystal orientations via scanning Laue diffraction microscopy for multi-peak Bragg coherent diffraction imaging

Combined Texture and Microstructure Analysis of Deformed Crystals by High-Energy X-ray Diffraction

Alignment of Sample Position and Rotation During in Situ Synchrotron X-ray Micro-Diffraction Experiments Using a Laue Cross-Correlation Approach

A Technique for In-Situ Displacement and Strain Measurement with Laboratory-Scale X-Ray Computed Tomography

Application of laboratory micro X-ray fluorescence devices for X-ray topography

Three-dimensional X-ray structural microscopy with submicrometre resolution

Simulations of x-ray diffraction from uniaxially-compressed highly-textured polycrystalline targets

Automated Analysis Framework of Strain Partitioning and Deformation Mechanisms Via Multimodal Fusion and Computer Vision

Through-Thickness Strain Scanning Using Synchrotron Radiation

Strain Measurements Using Real Time X‐ray Images

Refinements for Bragg coherent X-ray diffraction imaging: Electron backscatter diffraction alignment and strain field computation

A New Method to Reliably Determine Elastic Strain of Various Crystal Structures from Atomic-Resolution Images

Towards a quantitative determination of strain in Bragg Coherent X-ray Diffraction Imaging: artefacts and sign convention in reconstructions

Unambiguous indexing of trigonal crystals from white‐beam Laue diffraction patterns: application to Dauphiné twinning and lattice stress mapping in deformed quartz

&Lt;title>simultaneous Strain and Displacement Measurements in Micromechanics</title>

Characterization of Crystallographic Structures Using Bragg-Edge Neutron Imaging at the Spallation Neutron Source

In situ synchrotron X-ray multimodal experiment to study polycrystal plasticity

Applications of Laue Diffraction in Rock Deformation Measurements

Texture tomography with high angular resolution utilizing sparsity