Absolute intensity calibration of samples at variable sample to detector distances in small angle X-ray scattering (SAXS)
Yueqian Fan,Rongchao Chen,Xiaoxia Shang,Haijuan Wu,Chunming Yang,Huiling Fan,Zhihong Li,Jiangang Chen,Dongfeng Li,Yueqian FanRongchao ChenXiaoxia ShangHaijuan WuChunming YangHuiling FanZhihong LiJiangang ChenDongfeng Lia State Key Laboratory of Clean and Efficient Utilization of Coal-based Energy,Taiyuan University of Technology,Taiyuan,Chinab Beijing Synchrotron Radiation Facility,Institute of High Energy Physics,Chinese Academy of Sciences,Beijing,Chinac Institute for Advanced Study,Wuhan University,Wuhan,Chinad Shanghai Synchrotron Radiation Facility,Shanghai Advanced Research Institute,Chinese Academy of Sciences,Shanghai,Chinae Laboratory of High Efficiency and Low Carbon Utilization of Coal,Institute of Coal Chemistry,Chinese Academy of Sciences,Taiyuan,Chinaf College of Chemistry and Chemical Engineering,Xingtai University,Xingtai,China
DOI: https://doi.org/10.1080/10739149.2024.2322721
2024-03-02
Instrumentation Science & Technology
Abstract:Small angle X-ray scattering (SAXS) is a widely used physical technique to characterize nanoscale materials. The absolute scattering intensity provides quantitative data to characterize the mass and density of the analyzed materials. However, the derivation of absolute scattering intensity usually requires the calibration of experimentally measured relative scattering intensity. The most common approach calibration employs standards with known differential cross sections. It is necessary to analyze the standard and samples under identical conditions, including the same distance from sample to detector. This study eliminates this limitation, i.e., the calibration may be achieved by measuring the standards and samples at different distances to the detector using variable sample locations.
chemistry, analytical,instruments & instrumentation