Abstract:Due to the nondestructive requirements of gem testing,evaluation of precious stones shows characteristics of science and uncertainty.Gemological application of X-ray Diffraction (XRD)is specialized,with its application mainly concentrated in three aspects:① Gemstone identification:phase identification of the monocrystalline gemstones and polycrystalline gemstones;origin of the gemstones;classification of the pleomorphic gem minerals.For example,according to the XRD patterns of microcrystalline cryptocrystalline quartz variants,different silica mineral phases of the chalcedony can be distinguished accurately;types of ‘Di’in bloodstone can be distinguished through the composition and content of clay mineral.②Research on crystal structure of the gem minerals:analysis of crystal chemistry of the monocrystalline gems with complex composition;situation of the substitution of mineral isomorphism;quality of the gem by using the degree of crystallinity.For example,through the c/a ratio in lattice parameters of beryl,aluminium octahedral isomorphism and the beryllium tetrahedral isomorphism can be distinguished.The relationship between the crystallinity calculated from XRD data and the quality of nephrite is close.③Development of gemological research technology:to monitor the process of gemstone optimization;to inspect the mineral crystal size, crystalline quality and internal stress during the synthetic process of gemstones;to research the artificial breeding technology based on the crystal structure of organic gemstones.Take the heat treatment process of spinel as example:magnesium irons moved from octahedral M—O to tetrahedral T—O,resulting in the bond length of M—O and T—O changing upon temperature and being reflected in the spinel color.During the synthesis process of topaz,XRD data shows that the structure of the formed fluorine topaz is similar to natural topaz at 770 -800℃.At 950℃ and 1000℃, the fluorine topaz is decomposed to corundum and mullite.XRD research in the gemological application began relatively recently in China.In other countries,application in gem identification,optimization and synthesis are relatively mature.There is still much room for the development of XRD when combined with other technologies such as the Scanning Electron Microscope and Proton Microprobe.

Influence of crystal materials on the synchrotron X-ray fluorescence analysis: A study of crystal and amorphous clinopyroxene

Effects of Multiple-Wave Interaction on X-Ray Fluorescence : A Synchrotron Experiment

Analysis of Fluid Inclusions by X-ray Fluorescence Using Synchrotron Radiation

Sample Thickness Effect Of Thermal Vibration Correction Within X-Ray Dynamical Theory For Germanium-Doped Silicon

Search for new scintillators by studying the fluorescence properties of powdered compounds with synchrotron radiation

High-energy X-ray diffraction experiment employing a compact synchrotron X-ray source based on inverse Compton scattering

Optimizing the slicing pattern of stress‐relief crystal analyzers for X‐ray Raman scattering

A Comparative Study of Experimental Configurations in Synchrotron Pair Distribution Function

Research Progress on the Crystal Structure Determination Using Electron Diffraction

The diffraction power of crystals with unknown atomic structures: calculation and application in quantitative phase analysis

Review on the Application of X-ray Diffraction in Gem Identification, Synthesis and Crystal Structure Research

The use of single-crystal cuvettes with the properties of an optical shutter in X-ray diffractometers

A diffraction effect in X-ray area detectors

Analysis of apatite crystals and their fluid inclusions by synchrotron radiation X-ray flourescence microprobe

Atomic-Scale Structure of Nanocrystals by High-Energy X-ray Diffraction and Atomic Pair Distribution Function Analysis: Study of FexPd100-x (x = 0, 26, 28, 48) Nanoparticles

Quantitative analysis of intermediately and infinitely thick samples with thin sample approach without sample preparation using confocal X-ray fluorescence

Improved Accuracy of Multicomponent Samples Analysis by X-Ray Fluorescence Using Relative Intensities and Scattered Radiation: A Review

Diffraction imaging for in-situ characterization of double-crystal x-ray monochromators

X-ray diffraction studies of miscut crystal surfaces and overlayers: a dynamical diffraction approach

Intrinsic Spatial Resolution Limit in Analyzer-Based X-Ray Phase Contrast Imaging Technique

Crystallographic Data Collection Using a Multilayer Monochromator on an Undulator Beamline at the Shanghai Synchrotron Radiation Facility