Abstract:For a century, x-ray crystallography has been conducted with one of the two extreme sample conditions: either a single crystal which produces a single set of diffraction spots directly corresponding to the geometric orientation of the crystal, or a powder sample which comprises a huge number of crystals so numerous that the diffraction spots overlap and merge into smooth rings while the geometric relation is completely lost and only the d-spacings information of diffraction planes is observed. High-pressure DAC is not optimized for either condition. Powder x-ray diffraction has the intrinsic limitations when the sample consists of multiple different phases with low symmetry. Diffraction rings cover most of the detector area, and only a couple of low angle diffraction rings are unique to a phase; most other rings overlap with one another and cannot be used for unique identiﬁcation or accurate determination of crystallographic parameters. New structures and minor phases are often overshadowed by the diffraction of major phases and are impossible to ﬁnd or identify. Advanced crystallographic software, such as Rietveld and LeBail reﬁnement methods, may get most out of a powder pattern, but cannot overcome the intrinsic limitations. In addition, the common practice of integrating the 2D ring into a 1D peak plot throws away the valuable information of a whole dimension, such as the azimuthal angle of diffraction spot around the ring. Single-crystal XRD contains orientation and geometrical relationship in addition to d-spacings and thus provides a deﬁnitive characterization of the unit cell and symmetry. Unless the crystal is orientated exactly relative to the incident monochromatic x-ray beam to satisfy the Bragg relation, the crystal gives no signal, and the detector remains empty. Rotating the crystal around the w-axis (perpendicular to the incident x-ray beam) can bring the crystal to Bragg condition and occasionally obtain single diffraction spots at a given angle and scanning step. In spite of the advantages, single crystal cannot be sustained through phase transitions and often breaks down into multiple crystals and generate spotty XRD patterns. Spottiness, that is generally regarded as a ﬂaw in powder XRD, can be turned into great advantages if we can separate individual crystallites and handle them as individual single crystals. The high-brilliance x-ray beam available at synchrotron facilities has made it possible to collect diffraction spots in a powder sample comprised of up to hundreds of submicron crystallites. The newly developed Multigrain Crystallography (MGC) package, which is a suite of programs used for processing and indexing diffraction spots, has been developed to separate and identify the crystallographic orientation of each individual crystallite in the aggregate of hundreds of crystallites. Once separated, the data set for each crystallite can be handled with the standard single-crystal reﬁnement program identical to a stand-alone single crystal, resulting in excellent statistics in reﬁnement and full coverage of the reciprocal space. The MGC method is very powerful in unequivocal determination of symmetry and unit cells, testing different indexing models, picking out minor phases, and resolving strain of individual crystallites, and will very likely replace the powder and single-crystal x-ray diffraction methods as the dominant crystallographic tool for future high pressure-temperature studies in DAC.

The use of single-crystal cuvettes with the properties of an optical shutter in X-ray diffractometers

A guide to sample delivery systems for serial crystallography.

A Novel Sample Delivery System Based on Circular Motion for in Situ Serial Synchrotron Crystallography.

Hermetic sample enclosure for simultaneous differential scanning calorimetry/synchrotron powder x-ray diffraction

Soft X-ray diffractometer for synchrotron radiation

A Comparative Study of Experimental Configurations in Synchrotron Pair Distribution Function

Education Program for Controversial Defect of Recent X-ray Instrument Termed As a Simultaneous Small Angle X-ray Scattering and Wide Angle X-ray Diffraction Measuring Instrument

The Method for Determining the Exact Single Crystal Orientation with Simultaneous X-Ray Energy Correction Using the Spectrum of Diffraction Losses

Diffraction imaging for in-situ characterization of double-crystal x-ray monochromators

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

Hard x-ray methods for studying the structure of amorphous thin films and bulk glassy oxides

Laboratory-scale X-ray Absorption Spectrometer with a Cylindrical Johansson Crystal Analyzer

Integrated sample-handling and mounting system for fixed-target serial synchrotron crystallography

Microplates For Crystal Growth And In Situ Data Collection At A Synchrotron Beamline

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source

Use of fixed targets for serial crystallography

Multi-use high/low-temperature and pressure compatible portable chamber for in situ grazing-incidence X-ray scattering studies

Liquid Metal Sample Holder for Low Angle X‐Ray Diffraction

The Use of Connected Masks for Reconstructing the Single Particle Image from X-Ray Diffraction Data. II. The Dependence of the Accuracy of the Solution on the Sampling Step of Experimental Data

Synchrotron Polychromatic X-Ray Laue Microdiffraction Study on the Microstructures of Crystalline Materials