Abstract:A Si(220) double-crystal monochromator for the energy range 10–30 keV is presented. It will be used for EXAFS as well as powder diffraction measurements. To determine the requirements for this monochromator we looked, apart from mean considerations, at the requirements dictated by EXAFS in transmission mode. For good data analyses the proper shape, amplitude, and location at the energy axis of each wiggle is required. Moreover it is essential to separate the wiggles from background and noise. For the latter a high flux through the sample is desirable, which can be achieved by horizontal focusing of the beam. For that we have chosen to bend the second crystal sagitally. The sagittal bending radius is adjustable between 50 and 0.8 m, because for different energies different sagittal radii are necessary to focus the beam on the sample. The mean meridional radius of the second crystal is fixed at 130 m, which is an optimization for 20 keV. The meridional radius of the first crystal can be tuned between 100 and 500 m. When this radius is set to 130 m the energy resolution is calculated to be 6, 3, and 35 eV for 10, 20, and 30 keV (for perfectly bent crystals). By changing the meridional radius of the first crystal, future users of this monochromator can make the trade off between resolution and intensity. Movement of the monochromator exit beam, during a scan, will occur due to the monochromator geometry, but is reduced as much as possible by using an asymmetrically cut second crystal, with an asymmetry angle of 2.5°. The average exit beam movement of the monochromator for a 1-keV scan is 20 μm. For 40% of the energy range (10–30 keV) the exit beam position remains within 10 μm. For the second crystal no translation stage is used. When using a translation stage it is difficult to keep the change in flux within acceptable limits, because an alignment error of 0.01 arcsec at 30 keV will result in a change in intensity of 1%.

Measurement of the Reflection Curve of Crystals Used in the Monochromator of X-ray Diffraction Beamline at NSRL

Diffraction imaging for in-situ characterization of double-crystal x-ray monochromators

Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements

The performance of X-ray diffraction and scattering endstation in NSRL and its typical applications in material science

A dynamic focusing x‐ray monochromator for a wiggler beam line at the SRS of the SERC Daresbury Laboratory (abstract)

Measurement of integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility

Monochromator development at 4W1B beamline of BSRF

Alignment of the photoelectron spectroscopy beamline at NSRL

Thermal deformation of cryogenically cooled silicon crystals under intense X-ray beams: measurement and finite-element predictions of the surface shape

Theoretical considerations on the design of three-beam X-ray monochromators for synchrotron radiation

Measurements of transmitted electron beam extinction through si crystal membranes

X-ray reflectivity with a twist: quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation

Increased spatial coherence length from an asymmetric crystal reflection at grazing exit

Study on Single-bounced Capillary Focus Based on NSRL X-ray Diffraction and Scattering Station

Precise Measuring of Crystals by X-Ray Laser Apparatus Interference

X-Ray Beamlines at the Superconducting Wiggler of Nsrl

Biopharmaceutical beamline TLS 15A1 for macromolecular crystallography at the National Synchrotron Radiation Research Center

In-situ Reflectivity Measurement in the Fabrication of Diamond X-ray Windows

New evaluation beamline for soft x-ray optical elements

Untersuchungen zur Verbesserung der Energieauflösung für Neutronenrückstreuspektrometer unter Verwendung von Idealkristallen mit geringer dynamischer Breite der Reflexionskurve

Crystal Cavity Resonance for Hard X Rays: A Diffraction Experiment