Dual-Level Enhanced Nonradiative Carrier Recombination in Wide-Gap Semiconductors: The Case of Oxygen Vacancy in SiO 2

Chen Qiu,Yu Song,Hui-Xiong Deng,Su-Huai Wei
DOI: https://doi.org/10.1021/jacs.3c09808
IF: 15
2023-11-03
Journal of the American Chemical Society
Abstract:The conventional single-defect-mediated Shockley-Read-Hall model suggests that the nonradiative carrier recombination rate in wide-band gap (WBG) semiconductors would be negligible because the single-defect level is expected to be either far from valence-band-maximum (VBM) or conduction-band-minimum (CBM), or both. However, this model falls short of elucidating the substantial nonradiative recombination phenomena often observed experimentally across various WBG semiconductors. Owing to more...
chemistry, multidisciplinary
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