Three-Dimensional Limit of Bulk Rashba Effect in Ferroelectric Semiconductor GeTe
Xu Yang,Xiao-Mei Li,Yang Li,Yan Li,Rui Sun,Jia-Nan Liu,Xuedong Bai,Na Li,Zong-Kai Xie,Lei Su,Zi-Zhao Gong,Xiang-Qun Zhang,Wei He,Zhaohua Cheng
DOI: https://doi.org/10.1021/acs.nanolett.0c03161
IF: 10.8
2020-12-02
Nano Letters
Abstract:Ferroelectric Rashba semiconductors (FERSCs) have recently attracted intensive attention due to their giant bulk Rashba parameter, α<sub>R</sub>, which results in a locking between the spin degrees of freedom and the switchable electric polarization. However, the integration of FERSCs into microelectronic devices has provoked questions concerning whether the Rashba effect can persist when the material thickness is reduced to several nanometers. Here we find that α<sub>R</sub> can keep a large value of 2.12 eV Å in the 5.0 nm thick GeTe film. The behavior of α<sub>R</sub> with thickness can be expressed by the scaling law and provides a 3D thickness limit of the bulk Rashba effect, <i>d</i><sub>c</sub> = 2.1 ± 0.5 nm. Finally, we find that the thickness can modify the Berry curvature as well, which influences the polarization and consequently alters the α<sub>R</sub>. Our results give insight into understanding the factors influencing α<sub>R</sub> in FERSCs and pave a novel route for designing Rashba-type quantum materials.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acs.nanolett.0c03161?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acs.nanolett.0c03161</a>.Additional information about the thin-film fabrication; detailed information about the ARPES measurement of the 2.5 nm GeTe/Si thin film and the characterization of the 2.5 nm sample quality; occupation number of electrons on surface states and bulk states; formula derivation of the scaling law of the Rashba parameter with thickness; and the model of carrier concentration calculation (<a class="ext-link" href="/doi/suppl/10.1021/acs.nanolett.0c03161/suppl_file/nl0c03161_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology