Feedback Enhanced Area-Efficient ESD Power Clamp Circuit

Zhaonian Yang,Liyao Wei,Gaoxiang Kai,Shi Pu,Biyun Wang,Jing Liu,Yuan Yang,Ningmei Yu
DOI: https://doi.org/10.1109/ted.2024.3418305
IF: 3.1
2024-07-26
IEEE Transactions on Electron Devices
Abstract:In this article, a feedback-enhanced power clamp circuit for on-chip electrostatic discharge (ESD) protection is proposed and verified using silicon data. To conserve the layout area, the conventional MOSFET capacitor is replaced with a parasitic n-well/p-substrate junction capacitor to detect ESD events. The feedback mechanism is carefully designed to prolong the turn-on duration of the clamp circuit, thereby enhancing the ESD robustness. Experimental results show that the proposed clamp, featuring a m wide clamping MOSFET, achieves a comparable transmission line pulsing (TLP) failure current of approximately 9.5 A when compared to the conventional RC triggered counterparts. Simultaneously, it reduces the layout area, enhances false triggering immunity, and enhances the robustness during long pulse events.
engineering, electrical & electronic,physics, applied
What problem does this paper attempt to address?