Area-saved and Low-Leakage Design of Power-Rail Clamp Circuit

Mohan Ji,Yuan Wang,Guangyi Lu,Xinan Wang
DOI: https://doi.org/10.1109/icsict.2016.7998732
2016-01-01
Abstract:An improved power-rail electrostatic discharge (ESD) clamp circuit is presented in this paper. The proposed circuit maintains a much lower leakage current over the static-triggered circuit while the false-triggering immunity of the design is fairly superior to the traditional transient-triggered circuit. Besides, by utilizing the feedback technique and capacitance-boosting technique, the area occupied is significantly cut down on the premise of abundant turn-on time of the clamp device. Simulations in a standard 65nm process have confirmed the superiority of the proposed circuit.
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