A Novel Low-Leakage Power-Rail Esd Clamp Circuit with Adjustable Triggering Voltage and Superior False-Triggering Immunity for Nanoscale Applications

Guangyi Lu,Yuan Wang,Yize Wang,Xing Zhang
DOI: https://doi.org/10.1109/ted.2017.2730203
IF: 3.1
2017-01-01
IEEE Transactions on Electron Devices
Abstract:A low-leakage electrostatic discharge power clamp with adjustable triggering voltage (V-t1) is proposed in this paper. By enabling the static detection path using the transient one, the proposed clamp achieves a wide range of adjustable V-t1 while maintaining low standby leakage current (I-leak), which overcomes the flaw of traditional static clamps. Besides, the adjustable V-t1 with low I-leak is attractive for nanoscale applications. Moreover, the proposed clamp achieves enhanced false-triggering immunity over traditional transient clamps. The proposed clamp is successfully verified in a 65-nm CMOS process. Aside from silicon verifications, detailed comparisons with prior arts and practical application concerns are also addressed in this paper.
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