Area-efficient Transient Power-Rail Electrostatic Discharge Clamp Circuit with Mis-Triggering Immunity in a 65-Nm CMOS Process

Yuan Wang,Guangyi Lu,Haibing Guo,Jian Cao,Song Jia,Xing Zhang
DOI: https://doi.org/10.1007/s11432-015-5398-3
2016-01-01
Science China Information Sciences
Abstract:A novel, area-efficient transient power-rail electrostatic discharge (ESD) clamp circuit is proposed in this work. Current-mirror capacitors are used to reduce the layout area. Logic threshold voltages of inverters are modified to ensure a fully active on-state for the clamp device in ESD conditions. The proposed circuit reduces the layout area by about 56% compared with a circuit without current-mirror capacitors. Transmission line pulse (TLP) test results based on a 65-nm CMOS process demonstrate that the proposed circuit is an efficient on-chip ESD protection scheme for this process. In addition, the proposed circuit achieves a good immunity to mis-triggering with respect to fast power-up transitions.
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