Evidences for diffusion-induced phase evolution and crack generation of intermetallic at Bi 2 Te 3 /Sn interface of thermoelectric generator electrode

Shuang Liu,Limin Ma,Cheng Zhen,Dan Li,Yishu Wang,Qiang Jia,Fu Guo
DOI: https://doi.org/10.1016/j.matchar.2023.113384
IF: 4.537
2023-10-14
Materials Characterization
Abstract:Bismuth telluride-based thermoelectric generators (TEG) were widely used in waste heat recovery, but the failure problem at the electrode interface was serious, which was related to the severe diffusion between Sn and Bi 2 Te 3 . However, the diffusion behavior and process have not been reasonably evaluated and mechanism analyzed, which was not conducive to the design and improvement of TEGs. In this work, hot-end electrode aging was performed at 150 °C, and the diffusion, intermetallic compounds (IMC), as well as crack induction between Bi 2 Te 3 and Sn-based solder were systematically investigated. It was found that the interdiffusion of Sn and Te atoms led to the formation of Bi 2 Te with HCP structure and SnTe with FCC structure at the interface. Bi 2 Te was a Bi-rich layer formed after the migration of Te atoms away from Bi 2 Te 3 , and SnTe had a double-layer structure respectively attributing to the diffusion of Sn and Te atoms. Diffusion-induced cracks tended to occur at Bi 2 Te/SnTe interfaces and SnTe/Sn interfaces. The former was related to the diffusion-induced phase transformation at the diffusion front of Sn atoms, while the latter generated from the initiation and expansion of Kirkendall voids. In addition, the brittleness of the Bi-rich phase aggravated the crack propagation. The shear test results of the electrodes confirmed that these cracks were the weakness of TEG electrodes. It was recommended to introduce a barrier layer at the interface to provide protection, and the fabrication of direct soldering was not suggested.
materials science, multidisciplinary,metallurgy & metallurgical engineering, characterization & testing
What problem does this paper attempt to address?