Abstract:The emergence of ferroelectricity near the morphotropic phase boundary in BiFeO3 directly during thin‐film growth is explored. The films form purely in the tetragonal phase with zero critical thickness. Signatures of monoclinic phase coexistence only appear upon cooling. The striking robustness of the high‐temperature tetragonal phase against depolarizing‐field‐induced domain formation enables the stabilization of metastable monoclinic structure at room temperature. Multiferroic BiFeO3 exhibits a morphotropic phase boundary at large compressive strain that merges metastable phases of tetragonal (T) and rhombohedral (R) character resulting in giant ferroelectric and electromechanical responses. To utilize this functionality in devices, it is essential to understand the response of these ferroelectric phases to the environment of a nanoscale heterostructure. Here, the emergence of ferroelectricity near the morphotropic phase boundary in BiFeO3 is explored directly during thin‐film growth, using optical second harmonic generation. It is found that the epitaxial films form at the growth temperature purely in the T phase with zero critical thickness for the spontaneous polarization. Signatures of monoclinic T‐like and R‐like phases only appear upon sample cooling. The robustness of a single‐domain configuration in the high‐temperature T phase is furthermore demonstrated during growth of capacitor‐like metal | ferroelectric | metal heterostructures. Here, a reduction in tetragonality, rather than multidomain formation, lowers the electrostatic energy in the few‐unit‐cell thickness regime. For this lower tetragonality, density‐functional calculations and scanning transmission electron microscopy point to the stabilization of a novel metastable monoclinic structure upon cooling toward room temperature. The synergistic combination of strain and electrostatic phase stabilization in BiFeO3 heterostructures hence provides a basis for designing new ferroelectric phases and ultrathin ferroelectric devices.

Origin of morphotropic phase boundary in thin-film Hf0.5Zr0.5O2 on the TiN electrode

Phase Transitions and Anti-Ferroelectric Behaviors in Hf1-xZrxO2 Films

Ferroelectric and dielectric properties of Hf0.5Zr0.5O2 thin film near morphotropic phase boundary

Stabilizing the Ferroelectric Phase of Hf 0.5 Zr 0.5 O 2 Thin Films by Charge Transfer

Stabilizing the Ferroelectric Phase of Hf_{0.5}Zr_{0.5}O_{2} Thin Films by Charge Transfer.

Shift of Morphotropic Phase Boundary in High-Performance [111]-Oriented Epitaxial Pb (zr, Ti)O-3 Thin Films

Exploring the role of TiN electrodes in the formation of ferroelectric HfxZr1-xO2 thin films through transmission electron microscopy

Effects of Growth Orientations and Epitaxial Strains on Phase Stability of HfO$_2$ Thin Films

Combined Electrostatic and Strain Engineering of BiFeO3 Thin Films at the Morphotropic Phase Boundary

Interface-engineered ferroelectricity of epitaxial Hf0.5Zr0.5O2 thin films

Revealing Morphotropic Phase Boundary and Phase Transition Behavior in Strained BiFeO3 Thin Films

Origin of Ferroelectric Phase Stabilization via the Clamping Effect in Ferroelectric Hafnium Zirconium Oxide Thin Films

Thickness Dependence of the Crystallization and Phase Transition in ZrO 2 Thin Films

Effects of Strain and Film Thickness on the Stability of the Rhombohedral Phase of Hf O 2

Epitaxial Hf0.5Zr0.5O2 Films: A Temperature Dependence Study

Effects of Strain and Film Thickness on the Stability of the Rhombohedral Phase of HfO2

Constructing Morphotropic Phase Boundary in Epitaxial BiFeO3 on SrTiO3 by Suppression of Strain Relaxation

Sharp Transformation across Morphotropic Phase Boundary in Sub‐6 nm Wake‐Up‐Free Ferroelectric Films by Atomic Layer Technology

Composition-phase structure relationship and thickness-dependent ferroelectricity of rhombohedral phase in [1 1 1]-textured Nb-doped Pb(Zr,Ti)O3 thin films

Electric-field-induced crystallization of Hf 0.5 Zr 0.5 O 2 thin film based on phase-field modeling

Electric-field-induced Phase Transitions in Co-Doped Pb(Zr1−xTix)O3at the Morphotropic Phase Boundary