A study of vertical and in-plane electron mobility due to interface roughness scattering at low temperature in InAs/GaSb type-II superlattices

S. Safa,A. Asgari,L. Faraone
DOI: https://doi.org/10.1063/1.4817088
IF: 2.877
2013-08-07
Journal of Applied Physics
Abstract:In this paper, we present a study of the effects of different superlattice structural parameters on the bandgap and on both the vertical and in-plane mobility of electrons in InAs/GaSb type-II superlattices using a fully numerical finite difference method. The analysis of our results clearly indicates the significance of interface roughness scattering and, in particular, that the influence of interface roughness correlation length and height is considerable. A comparison of our calculated results with published experimental data is shown to be in good agreement.
physics, applied
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