Lattice constants and optical response of pseudomorph Si-rich SiGe:B

O. Caha,P. Kostelník,J. Šik,Y. D. Kim,J. Humlíček
DOI: https://doi.org/10.1063/1.4830367
IF: 4
2013-11-11
Applied Physics Letters
Abstract:Pseudomorph epitaxial films of Si1−xGex:B were grown on undoped (100) Si for x ≤ 0.026 and the B concentration of 1.3 × 1020 cm−3.The in-plane and out-of-plane lattice constants were determined using the X-ray techniques for 004 symmetric and 224 asymmetric diffraction. The influence of B and Ge co-doping has been detected in reflectance and ellipsometric spectra from infrared to ultraviolet. Free-hole plasma and Fano-type resonances of Si phonons and localized 11B and 10B vibrations have been observed. The spectral shift of E1 electronic transitions has been quantified. We found a simple way to test the variations of Ge content using relative reflectance spectra.
physics, applied
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