Study on the Thermal Stability of Molybdenum Oxide‐Passivated Silicon Solar Cells

Zhiyang Cui,Yicong Pang,Hanbo Tang,Zhaolang Liu,Taojian Wu,Zilei Wang,Hao Lin,Pingqi Gao
DOI: https://doi.org/10.1002/solr.202300849
IF: 9.1726
2024-04-08
Solar RRL
Abstract:For the thermal stability of MoOx, this study focuses on oxygen diffusion during annealing. It is found that without a protective layer, the oxygen in the air can diffuse into the interface and the oxygen in MoOx can diffuse in two directions, leading to a reduction in its work function and thickening of the SiOx interface. Dopant‐free heterojunction (HJ) solar cells are known for their simple process conditions and low parasitic absorption. However, stability issues remain one of the major obstacles for further development of cells with transition metal oxides (TMOs). Therefore, this research demonstrates the mechanism of thermal annealing degradation effects on TMOs/silicon (Si) HJ, namely, the infiltration of oxygen from air and the bidirectional diffusion of oxygen from TMOs, by investigating a typical molybdenum oxide (MoOx)/Si contact. A dense Au interlayer is introduced to block the interdiffusion of oxygen from the MoOx/Si interface and its surrounding environment. As a result, the dense layer slows down the interfacial oxidation of MoOx/Si and the degradation of the MoOx work function, thus improving the stability of the MoOx/Si HJ to 200 °C. The diffusion of oxygen from MoOx to the MoOx/Si interface will be critical to further promote the thermal stability of the devices thereafter, especially for the cells with i‐a‐Si:H layer as the passivation layer. To attain stable dopant‐free cells with MoOx, it is crucial to prevent oxygen diffusion into Si while maintaining a high MoOx work function and a thin SiOx layer at the interface.
energy & fuels,materials science, multidisciplinary
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