Experimental performance comparison of six-pack SiC MOSFET and Si IGBT modules paralleled in a half-bridge configuration for high temperature applications

S. Tiwari,O. M. Midtgård,T. M. Undeland,R. Lund,O.-M Midtgard
DOI: https://doi.org/10.1109/wipda.2015.7369260
2015-11-01
Abstract:In this paper, the switching performance of a six-pack SiC MOSFET module (CCS050M12CM2) is investigated experimentally using a standard double pulse test method. The upper three and the lower three MOSFETs of the CCS050M12CM2 are paralleled forming a half-bridge configuration. Moreover, the performance comparison of the CCS050M12CM2 is carried out with a pin to pin compatible Si IGBT module (CCS050M12CM2) of the same rating. Thus, switching and driving energy losses can be compared fairly. Laboratory results show that CCS050M12CM2 switches much faster compared to CCS050M12CM2 provided the same gate resistor is used. The measured total driving and switching energy losses are approximately 4 times in CCS050M12CM2 compared to CCS050M12CM2 at 25 °C. Moreover, the total switching energy loss is nearly independent of the temperature for CCS050M12CM2, whereas, CCS050M12CM2 has 1.6 times higher switching energy loss at a junction temperature of 175°C compared to 25 °C.
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