Failure Analysis of a Bus Circuit under Slow Power-on Induced by Process Deviation

Shuo Wang,Dongmei Li,Hao Hu,Tingyao Zhang,Shijian Li,Xinzhong Zhu,Yiming Qu,Yi Zhao,Pengfei Lian
DOI: https://doi.org/10.1109/ipfa61654.2024.10691138
2024-01-01
Abstract:Failure analysis of a bus circuit under slow power-on induced by process deviation. A bus circuit fails with slow power-on at low temperature. The failure reason of the bus circuit is the reference source of the transmitter is invalid, which is resulted in the offset of the amplifier of the reference source. The failure mechanism of the bus circuit is analyzed. The offset of the amplifier of the reference source is resulted in the process deviation of the reference source. If the power-on time of the bus circuit is long, the diode of the triode of the reference source is not open, resulting in failure of the reference source. To avoid this failure, the increased test with longer power-on time is proposed.
What problem does this paper attempt to address?