Abstract:Dynamic testing of high-resolution Sigma-Delta $(\Delta\Sigma)$ Analog-to-Digital converters (ADCs) is extremely challenging and expensive since it requires the use of spectrally pure stimulus with at least 10dB better signal-to-noise ratio (SNR) and total harmonic distortion (THD) than the ADC under test. This paper presents a low cost model parameter estimation based test and diagnosis methodology for the dynamic specifications of high-precision $\Delta\Sigma$ ADCs using a multi-tone test input. In the proposed test methodology, the response of a behavioral model of the ADC incorporating its key module level non-idealities is matched with the response of the ADC under test by solving a nonlinear optimization problem that finds the best non-ideality parameters corresponding to the observed DUT test response. The dynamic specifications of the ADC are then calculated from the derived model parameters. The multi-tone test stimulus is designed in such a way as to maximize the accuracy with which the model non-ideality parameters can be calculated from the observed test response using a genetic test stimulus optimization algorithm. For test response analysis, the digital pulse sequence at the output of the sigma-delta modulator is made externally observable and utilized as a test access point. A key contribution is that the dynamic specifications such as ENOB, SNR, and THD of the converter as well as module level non-idealities contributing to those specifications can be simultaneously determined from the derived model parameters. The test method is fast and diagnosis is very accurate. Simulation results indicate the validity of the proposed methodology.

A Novel Histogram Test for Estimating Integral Nonlinearity Errors of Analog-to-Digital Converters

Modeling of a 14-bit, 100-MS/s pipelined ADC with digital nonlinearity calibration

Estimation for ADC's INL Using a Moving-Average Filter

Accurate Exponential Histogram Test Method for ADC Linearity Test

Determining ADC effective number of bits via histogram testing

New Dynamic Test Methods for Determination of Nonlinearity and Effective Resolution of A/D Converters

A Calibration Scheme for a 800-Ms/s 14 Bit Pipelined ADC in 28-Nm CMOS

Effective ADC linearity testing using sinewaves

A Novel Linear Histogram BIST for ADC

A/D Converter INL and DNL Estimation with a Distorted Sinusoidal Stimulus Signal

Dynamic testing and diagnostics of A/D converters

Low-Cost Linearity Testing of High-Resolution ADCs Using Segmentation Modeling and Partial Polynomial Fitting

USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test

ADC Parameter Test Based on Improved Maximum Likelihood Estimation

Improved Determination of the Best Fitting Sine Wave in ADC Testing

A Novel Approach to Calibrate Open-Loop Amplifier Nonlinearities Through Piecewise Linear Interpolation

Signature Testing and Diagnosis of High Precision S? ADC Dynamic Specifications Using Model Parameter Estimation

ADC Testing With Verification

Testing and optimizing ADC performance: a probabilistic approach

Estimation of Channel Mismatches in Time-Interleaved Analog-To-Digital Converters Based on Fractional Delay and Sine Curve Fitting

Sine approximation-based comparison method for determining the phase-frequency characteristic of analog-to-digital converters