Abstract:The sine wave test of an analog-to-digital converter (ADC) means to excite the ADC with a pure sine wave, look for the sine wave which best fits the output in least squares (LS) sense, and analyze the difference. This is described in the IEEE standards 1241–2000 and 1057–1994. Least squares is the “best” fitting method most of us can imagine, and it yields very good results indeed. Its known properties are achieved when the error (the deviation of the samples from the true sine wave) is random, white (the error samples are all independent), with zero mean Gaussian distribution. Then, the LS fit coincides with the maximum likelihood estimate of the parameters. However, in sine wave testing of ADCs, these assumptions are far from being true. The quantization error is partly deterministic, and the sample values are strongly interdependent. For sine waves covering less than, say, 20 quantum levels, this makes the sine wave fit worse than expected, and since small changes in the sine wave affect the residuals significantly, especially close to the peaks, ADC error analysis may become misleading. Processing of the residuals [e.g., the calculation of the effective number of bits, (ENOB)] can exhibit serious errors. This paper describes this phenomenon, analyzes its consequences, and suggests modified processing of samples and residuals to reduce the errors to negligible level.

Effective ADC linearity testing using sinewaves

Improved Determination of the Best Fitting Sine Wave in ADC Testing

ADC Testing With Verification

A 14bit 500MS/s 85.62dBc SFDR 66.29dB SNDR SHA-less pipelined ADC with a stable and high-linearity input buffer and aperture-error calibration in 40nm CMOS

Accurate Exponential Histogram Test Method for ADC Linearity Test

Dynamic testing and diagnostics of A/D converters

Determining ADC effective number of bits via histogram testing

A Fully Digital-Compatible BIST Strategy for ADC Linearity Testing

A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing

Acceleration of the ADC Test With Sine-Wave Fit

Sinewave Fit Algorithm Based on Total Least-Squares Method with Application to ADC Effective Bits Measurement

An Improved Sine Fitting Test for the Data Acquisition System

Improved Static Testing of A/D Converters for DC Measurements

High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm

Full information ADC test procedures using sinusoidal excitation, implemented in MATLAB and LabVIEW

New Dynamic Test Methods for Determination of Nonlinearity and Effective Resolution of A/D Converters

High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy

A/D Converter INL and DNL Estimation with a Distorted Sinusoidal Stimulus Signal

Experimental Comparison of Different Standards for Dynamic Characterization of ADCs

Windows for ADC dynamic testing via frequency-domain analysis