Abstract:Dynamic testing of high-resolution Sigma-Delta $(\Delta\Sigma)$ Analog-to-Digital converters (ADCs) is extremely challenging and expensive since it requires the use of spectrally pure stimulus with at least 10dB better signal-to-noise ratio (SNR) and total harmonic distortion (THD) than the ADC under test. This paper presents a low cost model parameter estimation based test and diagnosis methodology for the dynamic specifications of high-precision $\Delta\Sigma$ ADCs using a multi-tone test input. In the proposed test methodology, the response of a behavioral model of the ADC incorporating its key module level non-idealities is matched with the response of the ADC under test by solving a nonlinear optimization problem that finds the best non-ideality parameters corresponding to the observed DUT test response. The dynamic specifications of the ADC are then calculated from the derived model parameters. The multi-tone test stimulus is designed in such a way as to maximize the accuracy with which the model non-ideality parameters can be calculated from the observed test response using a genetic test stimulus optimization algorithm. For test response analysis, the digital pulse sequence at the output of the sigma-delta modulator is made externally observable and utilized as a test access point. A key contribution is that the dynamic specifications such as ENOB, SNR, and THD of the converter as well as module level non-idealities contributing to those specifications can be simultaneously determined from the derived model parameters. The test method is fast and diagnosis is very accurate. Simulation results indicate the validity of the proposed methodology.

Signature Testing and Diagnosis of High Precision S? ADC Dynamic Specifications Using Model Parameter Estimation

Modeling of a 14-bit, 100-MS/s pipelined ADC with digital nonlinearity calibration

Modeling of digital background calibration with signal-dependent dithering for a 14-bit, 100-MS/s pipelined ADC

A Calibration Scheme for a 800-Ms/s 14 Bit Pipelined ADC in 28-Nm CMOS

A Maximum-Likelihood-Estimation-Based Digital Background Calibration Technique for Interstage Gain Error in Pipelined ADCs

ADC Parameter Test Based on Improved Maximum Likelihood Estimation

ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions

Research on Analog-to-Digital Converter (ADC) Dynamic Parameter Method Based on the Sinusoidal Test Signal

Parameter Optimization Of Deterministic Dynamic Element Matching Dacs For Accurate And Cost-Effective Adc Testing

ADC Testing With Verification

Dynamic testing and diagnostics of A/D converters

A/D Converter INL and DNL Estimation with a Distorted Sinusoidal Stimulus Signal

High-Precision ADC Testing with Relaxed Reference Voltage Stationarity.

Low cost high accuracy method for testing A/D dynamic parameters

A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations

Improved Determination of the Best Fitting Sine Wave in ADC Testing

Testing high resolution ADCs using deterministic dynamic element matching

Testing High Resolution Adcs With Low Resolution/Accuracy Deterministic Dynamic Element Matched Dacs

Testing and optimizing ADC performance: a probabilistic approach

New Dynamic Test Methods for Determination of Nonlinearity and Effective Resolution of A/D Converters