Abstract:Dynamic testing of high-resolution Sigma-Delta $(\Delta\Sigma)$ Analog-to-Digital converters (ADCs) is extremely challenging and expensive since it requires the use of spectrally pure stimulus with at least 10dB better signal-to-noise ratio (SNR) and total harmonic distortion (THD) than the ADC under test. This paper presents a low cost model parameter estimation based test and diagnosis methodology for the dynamic specifications of high-precision $\Delta\Sigma$ ADCs using a multi-tone test input. In the proposed test methodology, the response of a behavioral model of the ADC incorporating its key module level non-idealities is matched with the response of the ADC under test by solving a nonlinear optimization problem that finds the best non-ideality parameters corresponding to the observed DUT test response. The dynamic specifications of the ADC are then calculated from the derived model parameters. The multi-tone test stimulus is designed in such a way as to maximize the accuracy with which the model non-ideality parameters can be calculated from the observed test response using a genetic test stimulus optimization algorithm. For test response analysis, the digital pulse sequence at the output of the sigma-delta modulator is made externally observable and utilized as a test access point. A key contribution is that the dynamic specifications such as ENOB, SNR, and THD of the converter as well as module level non-idealities contributing to those specifications can be simultaneously determined from the derived model parameters. The test method is fast and diagnosis is very accurate. Simulation results indicate the validity of the proposed methodology.

Dynamic testing and diagnostics of A/D converters

Modeling of a 14-bit, 100-MS/s pipelined ADC with digital nonlinearity calibration

A/D Converter INL and DNL Estimation with a Distorted Sinusoidal Stimulus Signal

Signature Testing and Diagnosis of High Precision S? ADC Dynamic Specifications Using Model Parameter Estimation

New Dynamic Test Methods for Determination of Nonlinearity and Effective Resolution of A/D Converters

Effective ADC linearity testing using sinewaves

Improved Static Testing of A/D Converters for DC Measurements

Windows for ADC dynamic testing via frequency-domain analysis

Research on Analog-to-Digital Converter (ADC) Dynamic Parameter Method Based on the Sinusoidal Test Signal

ADC Testing With Verification

Low cost high accuracy method for testing A/D dynamic parameters

INL and DNL Estimation Based on Noise for ADC Test

Differential Sampling of AC Waveforms Based on a Commercial Digital-to-Analog Converter for Reference

Improved Determination of the Best Fitting Sine Wave in ADC Testing

A Fully Digital-Compatible BIST Strategy for ADC Linearity Testing

Static and dynamic test of high resolution DAC based on over sampling and low resolution ADC

Experimental implementation of test method for dynamic characterization of DAC based on over sampling and low resolution ADC

A 10-bit 30-MS/s 50mW pipelined A/D converter

Full information ADC test procedures using sinusoidal excitation, implemented in MATLAB and LabVIEW

Testing high resolution ADCs using deterministic dynamic element matching