Effect of Dislocations on Electrical and Optical Properties of N-Type Al0.34Ga0.66N

K. X. Chen,Qi Dai,W. Lee,J. K. Kim,E. F. Schubert,James R. Grandusky,Mark C. Mendrick,X. Li,J. Smart
DOI: https://doi.org/10.1063/1.3021076
IF: 4
2008-01-01
Applied Physics Letters
Abstract:The effect of edge and screw dislocations on the electrical and optical properties of n-type Al0.34Ga0.66N is investigated. It is found that edge dislocations strongly affect the electrical properties of n-type Al0.34Ga0.66N. Both free carrier concentration and mobility decrease with increasing edge dislocation density. Edge dislocations also enhance nonradiative recombination, which is indicated by decreasing near-band-edge UV as well as parasitic blue photoluminescence. The UV/blue ratio is found to be independent of the edge dislocation density but strongly depends on the Si doping concentration.
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