Nanowire FETs with Nearly Single-Crystalline Si Channels by NiSi2-Seed Initiated Lateral Epitaxial Crystallization (SILEC)

Baotong Zhang,Yuancheng Yang,Ran Bi,Haixia Li,Xiaoyan Xu,Xia An,Ru Huang,Ming Li
DOI: https://doi.org/10.1109/led.2023.3335922
IF: 4.8157
2024-01-01
IEEE Electron Device Letters
Abstract:In this letter, high-performance p-type nanowire field-effect transistors (NWFETs) with nearly single-crystalline Si channels were fabricated. By NiSi2 seed-initiated lateral epitaxial crystallization, a large nearly single-crystalline Si region up to 2-mu m x 24-mu m has been obtained with a CMOS-compatible process. Furthermore, utilizing the asymmetrical seed window design, a 20-nmwide nearly single-crystalline Si nanowire was formed in the active area, followed by the feasible fabrication of p-type NWFETs. The as-fabricated p-type NWFETs exhibit high hole mobility (-.51.4 cm(2)/Vs), subthreshold swing (-.66.5-mV/dec), and low off-state current (-.4.1-pA/mu m). The high-quality crystallization and the interface flatness were characterized by scanning electron microscopy. This work offers a promising method to realize top-tier circuits for low-power and low-cost monolithic three-dimensional integration.
What problem does this paper attempt to address?