Electron States at a Solid Interface

Y X Zhang,K M Chen,G,K Wu,C Y Li,S X Jin,Z N Gu,X H Zhou
DOI: https://doi.org/10.1088/0953-8984/8/45/006
1996-01-01
Journal of Physics Condensed Matter
Abstract:Electron states at a solid /Si(111) interface have been studied by the deep-level transient spectroscopy (DLTS) technique. An electron trap, (0.31), and three hole traps, (0.27), (0.36) and (0.47), exist at the solid interface. and are the dominant deep levels with densities of the order of magnitude , and both of them probably originate from the dangling bonds on silicon(111) surfaces. The fact that the density of the interface states at the interface is low indicates that passivates the Si surface.
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