Hf-Contacted High-Performance Air-Stable N-Type Carbon Nanotube Transistors

Xiaohui Liu,Zhiqiang Wu,Delin Hong,Weifeng Wu,Chenqiao Xue,Xiang Cai,Sujuan Ding,Fenfa Yao,Chuanhong Jin,Sheng Wang
DOI: https://doi.org/10.1021/acsaelm.1c00767
IF: 4.494
2021-01-01
ACS Applied Electronic Materials
Abstract:We have demonstrated air-stable n-type single-walled carbon nanotube (SWCNT)-based field-effect transistors (FETs) with hafnium (Hf) contacts. Unlike previously reported p-type characteristics for SWCNT FETs with Hf contacts, our devices exhibit typical n-type characteristics with a room-temperature ON-state conductance of approximately 0.36 G(0,CNT) (with G(0,CNT) = 4 x e(2)/h being the quantum conductance limit for the SWCNTs). The device performance relies on the diameter of the SWCNTs. It is demonstrated that devices with a CNT diameter of larger than 1.6 nm show a near-Ohmic contact. The devices also show good long-term stability in ambient air for more than 3 months. Furthermore, we characterize the oxidization properties of the Hf electrode in ambient air and find that a thin oxidized layer is formed on the electrode, which indicates the self-limiting nature of the oxide. Our work indicates that Hf contacts have the potential to be used in future carbon-based electronics and photoelectronics.
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