Fabrication And Characterization Of Si Nanowire Scaling To 20 Nm By Spacer Technology

Xiang Han,Wengang Wu,Ling Xia,Jun Xu,Guizhen Yan
2007-01-01
Abstract:Suspended silicon nanowires with line widths of 20 similar to 30 nm have been fabricated successfully by spacer technology. Both wet-etching and hydrofluoric vapor-phase-etching release methods are developed to realize the suspended structures. Current-voltage characteristics of the silicon nanowires with different kinds of doping are investigated, and mechanical vibration of nano-cantilevers is also observed. The silicon nanowires can be used as a nano-template for different applications.
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