Fabrication and Characterization of Ge Nanodot/si Nanowire Composite Structures

YE Min-hua,WANG Ding-di,XU Zi-jing,PU Lin,SHI Yi,HAN Min,ZHANG Rong,ZHENG You-dou
2010-01-01
Abstract:Ge nanodot/Si nanowire composite structures were fabricated by combining metal-particle-assisted chemical etching and low pressure chemical vapor deposition,and the microstructures were characterized by SEM,TEM and an united test system of AFM and micro-Raman.SEM and TEM results observed that Ge nanodots uniformly distributed over the whole surface of the Si nanowire.The size and density of Ge nanodots could be controlled by the growth parameters.Micro-Raman demonstrated that the feature peaks of Si and Ge for the individual mesostructure wire,which is extremely shallow and thin,had a large redshift due to the strain and temperature effects.
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