Fabrication of High-Compact Nanowires Using Alternating Photoresist Ashing and Spacer Technology

Haiyang Mao,Wengang Wu,Yulong Zhang,Ge Zhai,Jun Xu
DOI: https://doi.org/10.1088/0960-1317/20/8/085029
2010-01-01
Journal of Micromechanics and Microengineering
Abstract:In this paper, we present an innovative sub-wavelength patterning method for fabricating high-compact nanowires, which adopts nanometer steps as sacrificial structures in spacer technology. The nanometer steps, with adjustable stair widths and heights, are produced by alternating processes of photoresist ashing and anisotropic etching. Nanometer sidewalls are then formed with the function of the steps as sacrificial structures in spacer technology. Subsequently, the nanometer sidewalls are transferred to the substrates to generate high-compact nanowires. A diversity of parallel nanowires of different shapes produced by this method have widths of 85-155 nm and spacings ranging from 150 nm to 440 nm. Also, the uniformity of the nanowires can be controlled in this method.
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