Mechanical Characterization Of Nems Based On Interferometry Measurement Of Beam Deflection

Yb Huang,Dc Li,Cg Hu,X Fu,Hx Zhang,Xt Hu
2005-01-01
Abstract:A method to accurately and verifiably measure mechanical properties in nanometer test structures is under development. The optical measurement system has been built up and phase-shifting interferometry was employed to obtain out-of-plane deflection profiles of micromachined nano scale beams (unloaded and loaded). And then the Young modulus, stress gradient and residual stress can be extracted by comparing measured and modeled deflection data. Taking the primary non-idealities into account, the accuracy of the measurement can be greatly improved. The whole method was verified to be feasible and accurate.
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