Low-Temperature Fabricated Amorphous Oxide Semiconductor Heterojunction Diode for Monolithic 3D Power Integration Applications

Xianda Zhou,Kai Wang,Yang Liu,Lei Lu,Johnny K. O. Sin
DOI: https://doi.org/10.23919/ispsd50666.2021.9452201
2021-01-01
Abstract:By integrating amorphous oxide semiconductor (AOS) power devices on top of the standard CMOS circuitry, monolithic 3D power integration could deliver extremely compact power electronic systems. An n-AOS/p+-NiO heterojunction diode is experimentally demonstrated with a maximum process temperature of only 300 °C. By utilizing the reduced surface field effect, the device has achieved a breakdown voltage of 70 V and a Baliga’s Figure-of-Merit of 168 kW/cm2. The low-temperature process and relatively high performance have made this technology promising for monolithic 3D power integration and other emerging power electronic applications.
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