Abstract:Solution derived La2Zr2O7 films have drawn much attention for potential applications as thermal barriers or low-cost buffer layers for coated conductor technology. Annealing and coating parameters strongly affect the microstructure of La2Zr2O7, but different film processing methods can yield similar microstructural features such as nanovoids and nanometer-sized La2Zr2O7 grains. Nanoporosity is a typical feature found in such films and the implications for the functionality of the films is investigated by a combination of scanning transmission electron microscopy, electron energy-loss spectroscopy and quantitative electron tomography. Chemical solution based La2Zr2O7 films deposited on flexible Ni-5at.%W substrates with a {100}<001> biaxial texture were prepared for an in-depth characterization. A sponge-like structure composed of nanometer sized voids is revealed by high-angle annular dark-field scanning transmission electron microscopy in combination with electron tomography. A three-dimensional quantification of nanovoids in the La2Zr2O7 film is obtained on a local scale. Mostly non-interconnected highly facetted nanovoids compromise more than one-fifth of the investigated sample volume. The diffusion barrier efficiency of a 170 nm thick La2Zr2O7 film is investigated by STEM-EELS yielding a 1.8 \pm 0.2 nm oxide layer beyond which no significant nickel diffusion can be detected and intermixing is observed. This is of particular significance for the functionality of YBa2Cu3O7-{\delta} coated conductor architectures based on solution derived La2Zr2O7 films as diffusion barriers.

Fabrication of Long Length Baseband of Buffer layer of Metal Organic Deposited Coating conductor La 2 Zr 2 O 7

Metal Organic Deposition of Lanthanum Zirconate Buffer Layer on Biaxially Textured Ni-5%W Substrate

Fabrication and Characterization of La2Zr2O7 Films on Different Buffer Architectures for YBa2Cu3O7−δ Coated Conductors by RF Magnetron Sputtering

Growth of Thick La2Zr2O7 Buffer Layers for Coated Conductors by Polymer-Assisted Chemical Solution Deposition

Improved Textured La2Zr2O7 Buffer Layers on Bi-Axially Textured Ni–W Substrates Using CeO2 Seed Layers for YBa2Cu3O7−x Coated Conductors

Tailoring the Crystallographic Orientation of MOD-derived La2Zr2O7 Buffer Layers for Coated Conductors

Polymer-assisted Chemical Solution Deposition of High-Quality La2Zr2O7 Buffer Layer Applied to Low-Cost YBCO-coated Conductors

Preparation of epitaxial La2-xGdxZr2O7 buffer layer for coated conductors using sol-gel method

Single Cerium Zirconate Buffer Layer on Biaxially Textured Metal Substrates for High Performance Coated Conductors

Seed layer, solution concentration and thickness effects on CSD-derived La2Zr2O7 buffer layers for coated conductors

Preparation of Gd2zr2o7 Buffer Layers for Coated Conductor by Polymer-Assisted Chemical Solution Deposition

Effect of the ZnO buffer layer thickness on AZO film properties

Preparation and Characterization of Ceo2/Ysz/Ceo2 Buffer Layers for Ybco Coated Conductors

Reel-To-Reel Deposition of Epitaxial Double-Sided Y2o3 Buffer Layers for Coated Conductors

Barrier efficiency of sponge-like La2Zr2O7 buffer layers for YBCO-coated conductors

Reel-To-Reel Continuous Deposition Of Ce(X)Zr(1-X)O(2) Single Buffer Layer For Ybco Coated Conductors

Epitaxial growth of Gd 2 Zr 2 O 7 /Y 2 O 3 buffer layers for YBa 2 Cu 3 O 7− δ coated conductors

Thickness Effect of Gd2Zr2O7 Buffer Layer on Performance of YBa2Cu3O7−δ Coated Conductors

Uniformity of Long-Length Double-Sided CeO_2 Buffer Layer for YBa_2Cu_3O_(7-δ) Coated Conductors

The influences of rapid growth of yttria-stabilized ZrO_2 buffer layers for YBCO coated conductors

Growth of Simplified Buffer Template on Flexible Metallic Substrates for YBa2Cu3O Coated Conductors