Thickness Effect of Gd2Zr2O7 Buffer Layer on Performance of YBa2Cu3O7−δ Coated Conductors

Wenbin Qiu,Feng Fan,Yuming Lu,Zhiyong Liu,Chuanyi Bai,Yanqun Guo,Chuanbing Cai

DOI: https://doi.org/10.1016/j.physc.2014.10.012

2014-01-01

Abstract:Bilayer buffer architecture of Gd2Zr2O7 (GZO)/Y2O3 was prepared on the biaxially textured tape of Ni-5 at% W (NiW) by reactive sputtering deposition technique. The buffer layer of GZO films were deposited with different thicknesses on Y2O3 seeding layer with a given thickness of 20 nm. According to the results of phi-scan, the in-plane FWHMs of GZO films decreased and then reversed with increasing thickness of GZO, which corresponded with the in-plane FWHMs and superconducting properties of YBa2Cu3O7-delta (YBCO) films. Reflection High-Energy Electron Diffraction (RHEED) was carried out to examine the surface texture of GZO films and the deteriorated surface alignment was found for thicker films. The thickness effect of GZO on performance of YBCO is the coupling result of surface texture and blocking effect caused by thickness. With the balance of these two factors, the YBCO/GZO(120 nm)/Y2O3/NiW architecture exhibit relatively high performance with the transition temperature T-c of 92 K, a transition widt Delta T-c below 1 K, and a critical current density J(c) of 0.65 MA/cm(2). (C) 2014 Elsevier B.V. All rights reserved.