Preparation and characterization of the CIGS thin films with double-graded band gap

Qiang LI,Zhen-feng KANG,Wen-de LIU,Ping-ping ZHENG,Ling-ling XIAO,Yue FAN,Qing-rui BO,Bin-bin QI,Tie-zhu DING
DOI: https://doi.org/10.3969/j.issn.1002-0322.2014.01.024
IF: 4
2014-01-01
Vacuum
Abstract:The CuIn (1-x)GaxSe2 thin films with different Ga contents were deposited on the soda lime glass by pulsed laser deposition method . The influence of different Ga contents on the films structure and optical properties were studied . The results show that: the optical band gap of the CIGS thin films increase with increasing the Ga contents . Then the CIGS films with good characteristics were sequentially deposited on the same soda lime glass . The elements of thin film were studied with XPS etching layer-by-layer , and the variation of band gap in the depth direction was calculated by the band gap approximate formula . Finally , double-graded band gap thin films with good structure , optical and electrical characteristics were obtained .
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